| 005 |
20240318105409.0 |
| 008 |
240105s2023 xxu eng d |
| 020 |
|a978-3-031-49018-7 |
| 022 |
|a1611-3349 |
| 040 |
|bspa |
| 041 |
|6eng |
| 100 |
1 |aIntxausti Arbaiza, Eneko |
| 245 |
10|aTowards robust defect detection in casting using contrastive learning|hDocumento científico MGEP|cEneko Intxausti, Ekhi Zugasti, Carlos Cernuda, Ane Miren Leibar, Estibaliz Elizondo |
| 260 |
|c2024 |
| 300 |
|a11 p |
| 546 |
|aInglés |
| 653 |
|aCongresos y conferencias |
| 653 |
|a2023-2024 |
| 653 |
|aAnálisis de datos y ciberseguridad |
| 653 |
|aDoctorando |
| 653 |
|aODS 9 Industria, innovación e infraestructura |
| 653 |
|aODS 12 Producción y consumo responsables |
| 700 |
1 |aZugasti Uriguen, Ekhi |
| 700 |
1 |aCernuda García, Carlos |
| 700 |
1 |aLeibar, Ane Miren |
| 700 |
1 |aElizondo, Estibaliz |
| 710 |
2 |aMondragon Goi Eskola Politeknikoa |
| 710 |
2|aFagor Ederlan, S. Coop. |
| 710 |
2|aEdertek S. Coop. |
| 773 |
|t26th Iberoamerican Congress on Pattern Recognition (CIARP 2023). Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications. Lecture Notes in Computer Science. Vol. 14469. Pp. 605-616, |
| 856 |
|uhttps://hdl.handle.net/20.500.11984/6291|yTestu osorako sarbidea/Acceso al texto completo/Full text access |
| 856 |
|uhttps://doi.org/10.1007/978-3-031-49018-7_43 |
