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1 |aIntxausti Arbaiza, Eneko |
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10|aA Methodology for Advanced Manufacturing Defect Detection through Self-Supervised Learning on X-ray Images|hDocumento científico MGEP|cEneko Intxausti, Danijel Skocaj, Carlos Cernuda and Ekhi Zugasti |
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|aNA/RI |
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|aGobierno Vasco. Grupos SISI. IT1676-22 |
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|aGobierno Vasco. Elkartek 2022. KK-2022/00049. Deep learning REcommended Manufacturing Imperfection Novelty Detection. DREMIND |
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|aInglés |
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|aJCR|b2.7|cENGINEERING, MULTIDISCIPLINARY|dQ2|e42/90|f2022 |
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|aSJR|b0.492|cFluid Flow and Transfer Processes|dC2|e33/87|f2022|f2024-02-23 |
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|aCiteScore|b4.5|cGeneral Engineering|dCS2|e73/302|f2022 |
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|aWeb of Science |
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|a2023-2024 |
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|aAnálisis de datos y ciberseguridad |
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|aODS 9 Industria, innovación e infraestructura |
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1 |aSkocaj, Danijel |
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1 |aCernuda García, Carlos |
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1 |aZugasti Uriguen, Ekhi |
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2 |aMondragon Goi Eskola Politeknikoa |
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2 |aUniversity of Ljubljana |
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|tApplied Sciences. Vol. 14. N. 7. N. art. 2785, |
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40|uhttps://hdl.handle.net/20.500.11984/6343|yTestu osorako sarbidea/Acceso al texto completo /Full text access |
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|uhttps://doi.org/10.3390/app14072785 |